Reliability Testing Report
Download the reliability qualification report by searching a SGMICRO part number.
Reliability capability
Test Item | Abbv. | Reference | Test Condition |
|---|---|---|---|
High Temperature Operating Life | HTOL | JESD22-A108 / JESD85 | Tj ≥ 125℃, Biased，1000/2000hrs or Equivalent |
High Temperature Reverse Bias | HTRB | JESD22-A108 | Tj ≥ 125℃, 0.8VR，1000/2000hrs or Equivalent |
High Temperature Gate Bias | HTGB | JESD22-A108 | Tj ≥ 125℃, VGS max, VDS=0V，1000/2000hrs or Equivalent |
Early Life Failure Rate | ELFR | JESD22-A108 / JESD74 | Tj ≥ 125℃, Biased，48/168hrs |
Preconditioning | PC / PRE | JESD22-A113 | Moisture Soak with appropriate MSL level |
Moisture Sensitivity Levels | MSL | JESD22-A113 / JEDEC J-STD-020 | Moisture Soak with appropriate MSL level |
Pressure Cook Test (Autoclave) | PCT | JESD22-A102 | 121°C, 100%RH, 29.7psia (2atm), 96/168/240hrs |
Unbiased Highly Accelerated Temperature & Humidity Stress Test | uHAST | JESD22-A118 | 130°C, 85%RH, 33.3psia, 96/192hrs |
Highly Accelerated Temperature & Humidity Stress Test | HAST / BHAST | JESD22-A110 | 130°C, 85%RH, 33.3psia, Biased, 96/192hrs 110°C, 85%RH, 17.7psia, Biased, 264/528hrs |
Steady State Temperature Humidity Bias Life Test | THB | JESD22-A101 | 85°C, 85%RH, Biased, 1000hrs |
High Temperature & Humidity Reverse Bias | H3TRB | JESD22 A-101 | 85°C, 85%RH, 0.8VR, 1000hrs |
High Temperature Storage Life | HTSL | JESD22-A103 | 150°C, 1000hrs |
Temperature Cycling Test | TCT | JESD22-A104 | '-65 °C ~ 150 °C, 500/1000cycles or Equivalent |
Solderability | SD | J-STD-002 | Steam aging:93°C, 8hrs; 245 ± 5°C |
ESD Human Body Model | HBM | JS-001 | Ta = 25 °C |
ESD Charged Device Model | CDM | JS-002 | Ta = 25 °C |
Latch-up | LU | JESD78 | Ta = 25 °C & TA max |
